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Beilstein J. Nanotechnol. 2019, 10, 1401–1411, doi:10.3762/bjnano.10.138
Figure 1: (A) Topographical and (B) phase-shift image, and (C) surface contact potential map of Au nanopartic...
Figure 2: (A, B) Determination of the surface contact potential decrease and the height of the Au NPs; (C) su...
Figure 3: Single-point I–V curves performed during the mechanical contact with the Pt-coated conductive tip o...
Figure 4: (A) Change of the I–V characteristics for ten repetitions of a single-point and (B) induced changes...
Figure 5: (A) SEM image of the Au layer (33 nm in thickness) on Bi2Se3 irradiated by the electron beam for di...
Figure 6: Maps of the surface contact potential measured by means of KPFM for the e-beam formed NIs on the Au...
Figure 7: (A) Topographical and (B) surface contact potential profiles of the 9 nm irradiated Mo layer; maps ...
Figure 8: UPS data for Bi2Se3; Mo or Au layers on the top of the Bi2Se3 cleaned by the Ar+ sputtering excited...
Figure 9: (A) Changes of the surface potential in the pattern after UV photodiffusion of Au (20 nm) into Bi2Se...